Research On Integrated Circuit Single Event Multiple Nodes Upset Hardened Latch Design

With the rapid development of semiconductor technology,the integration of chips has been continuously improved due to the reduction of the process size,which has led to improved performance and has become more and more sensitive to soft errors.The soft error is a recoverable error caused by a transient fault in a circuit caused by the impact of radiated particles.With the development of integrated circuit technology to the deep nanometer area,soft errors have become an essential factor leading to circuit failure.Therefore,it is necessary to strengthen the circuit to ensure the system’s stable operation,especially in some critical applications working in complex radiation environments.Based on the problem of the soft error caused by the single event effect of the integrated circuit in the radiation environment,circuit operation reliability caused by triple node upset and quadruple node upset,in view of the shortcomings of existing radiation-hardened latches in hardened performance and cost,two radiation-hardened designs are proposed:(1)Aiming at the defects of high power consumption,delay,and area overhead of existing hardened latches,this paper designs a low-overhead triple node upset hardened latch NHTNURL.The design connects three DICEs through the clock-controlled inverters and a common node.The hardened capability of DICE itself,feedback circuit structure,and current competition are used to realize the ability to tolerate triple node upset and self-recovery.The simulation results verify that the NHTNURL latch can tolerate triple node upset and self-recovery.Compared with other triple node upset hardened designs,the NHTNURL latch reduces power consumption by 19.0%,delay by 23.9%,area overhead by 7.8%,and APDP by 54.4%,it has better overhead control and confident radiation-hardened performance.(2)To further improve the hardening performance and reliability of the latch,this paper designs a quadruple node upset tolerant and self-recovering hardening latch NHQNURL.Based on the NHTNURL latch,the structure further improves the radiation-hardened performance by adding redundant units and nodes to realize the tolerance of quadruple node upset and self-recovery.Simulation results verify that the NHQNURL latch can tolerate quadruple node upset and self-recovery.Compared with other quadruple node upset hardened latches,the NHQNURL latch reduces the delay and area cost by 51.5% and 18.0% at the expense of power consumption.At the same time,the latch can self-recover and is insensitive to high resistance states.It has better radiation-hardened performance.Voltage and temperature variation experiments show that the proposed latches are not sensitive to changes in temperature and voltage,so they are more suitable for some critical applications operating in complex radiation environmental conditions.Figure [43] Table [7] Reference [71]...