Design Of Automatic Test System For The Power Driver Chip

With the development of integrated circuit,the structures of chips are getting more and more complicated.More and more functional modules are designed in a chip.In addition,there are more and more external function pins in a chip.The requirements for testing is also getting strict.The commercial chips driver are tested by the ATS(Automatic Test System)for mass production.However,the performance and function modules of automatic test system which is in existence don't exactly match the chip which was designed for the market recently.Taking method of manual test is too inefficient and costly.So,it is urgent that developing an equipment which can test the chip.An automatic test system that is used to test the IR2136 of Infineon is designed in this thesis.First of all,the technology about testing all over the world is introduced.Then the testing principle and plan of the driver chip are discussed.It is inefficient to test the power driver chip due to many parameters in the chip and many instruments needed.To improve testing efficiency,the hardware circuit is designed and the client program which is based on C/C++ is developed by the idea of modularization.In the system hardware,the test system can manage trouble in a short time by the state machine.In the system software,to avoid the noise impact of test system,the method of extremum is used.In addition,to reduce the line error and the random error of test results,the least-squares method is used.The automatic test system tests the static parameters and dynamic parameters by clicking a button.The error of the test results is less than 3%.The test time is short and the test results indicate that the automatic test system has the ability of consistency.The test system operated reliably and test results are accurate.The performance of the test system meets the expected target.