The Design And Implementation Of Digital Integrated Circuit Test System Driver

With the advancement of science and technology,the integrated circuit industry has achieved rapid development.As an important means to ensure the performance and quality of integrated circuits,integrated circuit testing technology has been deeply studied.The digital integrated circuit test system is an important tool for testing the electrical parameters and performance of digital integrated circuits.With the increasing integration of integrated circuits and the increasing number of pins,the functions provided by an integrated circuit are becoming increasingly large,and integrated circuit test systems need to provide more powerful test functions to meet the test requirements.This paper realizes the design of the digital integrated circuit test system driver,which can effectively control the hardware system of the test machine with the interface and complete the corresponding test of the digital integrated circuit.This paper adopts the idea of layered design to make the driver more scalable and maintainable.This paper has carried out the following research on the digital integrated circuit test system driver:(1)This paper analyzes the test procedure of DC parameter test and function test,summarizes the call flow of the drive interface in the driver.In addition to the insufficient storage space provided by the test board on the hardware device,this paper adds the software flow design of the dynamic import of the timing set parameters and the dynamic reading of the history parameters.Under this process design,the test system can support more vector sets for functional testing.According to the integrated circuit test principle and the above test flow,this paper summarizes the functional interfaces during the test and completes the framework design of the driver.(2)This paper divides the driver into device layer,function layer and system layer.The device layer is responsible for extracting the basic device class on the test board and providing the operation method in each device class;the functional layer uses the logic combination and combination of various device objects to realize the functional modules required by the digital integrated circuit test system;the system layer is responsible for manage hardware resources in the test machine and provide callable driver interfaces and data transfer functions to the upper layer program.(3)In the aspect of bus transmission interface design,this paper adopts the programming idea of interface and implementation separation and the design method of dependency injection.The driver gives the abstract class of universal transmission interface,completes the implementation of universal transmission interface in specific bus transmission class.This design allows the driver to support multiple bus protocols,and increases driver portability.