Research On The Integrated Circuit Automatic Test System Based On FPGA

Integrated circuit testing is a very important part of the integrated circuit industry,and the integrated circuit test system is an indispensable tool for implementing integrated circuit testing.Due to the advantages of strong programmability and flexible application of Field Programmable Gate Array(FPGA),in recent years,many small-scale integrated circuit test systems based on FPGA have been designed in China.This kind of system uses the customized design method to design the test board and the test interactive software system,so this system is not very versatile,and the re-development cost of the system is high.There are many restrictions to use these systems.How to design a universal and low-cost integrated circuit test system has become a hot issue in the industry.This paper takes the common integrated circuits within 48 pins as the research object.Based on the V58300 FPGA hardware platform independently developed by the Institute of Microelectronics of the Chinese Academy of Sciences,this paper expands the development methods of its original customized test boards and test programs,and studies and establishes a universal test board and test interaction software system.The test board is the medium for signal transmission between the test system and the chip under test.The test interactive software system includes computer software and FPGA software.The computer software is used to control the test system and display test results.The FPGA software is used to generate test stimulation signals and test results.In this paper,a universal test board is designed and implemented by designing the circuit structure of the tested chip socket with selectable pin attributes.The test board can realize the accurate connection of the test system and all the different tested chips.Then,taking the Static Random Access Memory(SRAM)integrated circuits which have the most extensive application fields and test requirements as the test target,on the basis of the traditional test interaction software system architecture,a configurable signal mapping circuit is added.And this paper designs and implements a universal SRAM-class integrated circuit test interactive software system.The test software system can test the function of different specifications of SRAM chips.Then the paper further expands the range of the target to be tested,innovatively simulates the principle of integrated circuit automatic test equipment,and takes the functional test vectors generated during the development of integrated circuits as input to establish a universal integrated circuit test interactive software system,which can be adapted all functional test of integrated circuits within 48 pins.Finally,the relative indicators of two systems are compared,and the advantages and disadvantages of the two test systems are discussed.Based on the V58300 FPGA hardware platform,this paper designs a universal test board and two types of test interactive software that successfully overcome the shortcomings of the current domestic small-scale integrated circuit test system,such as poor universality and high cost of re-development.The reliability and universality of the two systems have been verified by many comparison experiments and the actual measurements of various chips.It is proved that the system described in this paper can be used in a variety of test scenarios,and it provides a reliable and universal design scheme for the small scale integrated circuit functional test system,which has very important application significance.