Development And Application Of SoC Chip Test System Based On ATE

The continuous improvement of integrated circuit manufacturing technology promotes the rapid development of chip design,which makes the internal integration of the chip higher and higher,and the communication speed of the interface faster and faster.But at the same time,the requirement of complex circuits for test coverage is also increasing.Although the design technology of IP(intellectual property)multiplexing can speed up the development process of SoC,with the increase of the number of integration on a single chip,the scale and complexity of SoC are increasing,which leads to the huge challenge of SoC Test.In order to ensure the quality of the chip,we must increase the test coverage;on the other hand,in order to control the cost of the chip,we can not increase the test time without limit.Therefore,how to reduce the test time without reducing the test coverage has become a big problem for major chip design companies and manufacturing enterprises.At present,most of the IC testing methods adopted by the international semiconductor manufacturers are completed by automatic test equipment.The chip testing based on ATE not only has the advantages of high testing efficiency,strong portability,high fault coverage and good versatility,but also has practical application significance.This paper takes a SoC chip independently developed by the company as the research object to study its test method.The main contents of this project are as follows:Firstly,the current status of chip development and the significance,methods and problems of chip testing are described and analyzed.Secondly,the framework and internal structure of the device under test are analyzed in detail,which lays a solid foundation for the subsequent test scheme.At the same time,the characteristics of v93000 ATE tester are introduced,and each process and method of ATE test engineering development are described in detail,which provides guarantee for the realization of subsequent test.Finally,taking the SoC chip as the research object and v93000 test platform as the condition,the specific test scheme and implementation process are discussed.According to the characteristics of the test platform,the dynamic and static power consumption and the main interface of the chip are tested and realized by using the method of combining the structure of the chip with the test theory.And the actual test results are given to verify that the test system basically meets the expected test performance requirements.