Design Of Hybrid Integrated Circuit Test Hardware Circuit Test Board

With the rapid development and progress of science and technology, hybridintegrated circuits (Hybrid Integrated Circuit，HIC) industry has made tremendousdevelopment. Hybrid integrated circuit testing is a major link in the IC industry chain，which ensure the design of the circuit to achieve the desired indicators. Hybridintegrated circuit test is a support technology in the IC industry，and the hybridintegrated circuit automatic test equipment （Automatic Test Equipment，ATE） is alsothe test essential equipment in conducting the IC verification.Therefore，to carry out thehybrid IC test technology research and development of automated test equipment is animportant job，It is necessary to shorten the gap in the industry with foreign country assoon as possible. Hybrid integrated circuit test equipment developed in this subject canpartly meet the need of the hybrid integrated circuit testing，and with the simple,inexpensive，very practical advantages，it can greatly improve the efficiency of the ICproduction and reduce production costs.The first chapter of this thesis describes the automatic test system of the hybridintegrated circuits and foreign development status，and analyzes the technical problemsfaced by the hybrid integrated circuit testing. The second chapter describes the basicknowledge involved in hybrid integrated circuit test board design，including theprinciple of hybrid integrated circuit testing, detailed description of the hybridintegrated circuit test method, the direct digital synthesis technology applications andtest vector generation technology.Chapters III and IV are the focus of this paper explain in detail the corecomponents of a hybrid integrated circuit test system-hybrid integrated circuit testhardware test board design. The third chapter focuses on the design of the test boardhardware platform, including hybrid integrated circuits to test the use of digital captureinstrument (DCI), analog capture instrument (ACI), a programmable power supplydesign, high-precision analog measuring instrument design. Chapter IV in detailintroduces FPGA logic design for hybrid integrated circuit testing, the tester chip logiccontrol design, including the control of the digital-to-analog capture chip, precision measurement unit control, programmable power supply control and memory read andwrite control. And including the logical design of the decoding and encoding of testvectors.Finally，giving a typical hybrid integrated circuit digital-to-analog converter(DAC) to illustrate the practical application of the test board circuit.Test the ADC staticparameters by selecting the highest frequency of testing，and get the test results of themain performance parameters of the chip, in accordance with DUT device manual bookindex,and all the requirements have been adopted, which means that we have developeda hybrid integrated circuit automatic test system to meet the expected need.