Soft Error Rate Study Based On SET Propagation Characteristic

With the development of electronic technology, large scale integrated circuit is widely used in aviation, spaceflight. Due to large amounts of radiation particles in the space environment, the soft error caused by these particles interfered with the normal work of electronic equipment and even resulted in failure. Soft error mainly comes from the single event upset of sequential circuits and the single event transient of combinational logic. In order to assess the soft error effect, the single event upset in register be taken into account, also the single event transient in combinational logic circuit. In this thesis, we study single event transient in combinational logic, when integrated circuit entering nanometer scale, the statistical data show that the occurrence probability of SET in the combinational circuits more than sequential circuits.In this thesis, the research content consist of three parts. First, we mainly paid attention to the single event transient pulse broadening, attenuation and filtering characteristics, also analyze and validate the transient pulse propagation model. Next,the study of the soft error analysis method of integrated circuit and modeling it. Finally,we chose test circuit to analyze and verify the model, also compared result with other model.In chapter 3, under the condition of 130 nm process, the transient pulse propagation was analyzed, which including broadening effect, attenuation effect,filtering effect. The transient pulse propagation model based on pulse effect was analyzed, average error of the model estimation value and Hspice simulation value is different by 1.302%, fan-out gate node, the size of the transistor and propagation delay for the influence of pulse propagation were analyzed. Through simulation and analysis in inverter chain, pulse effect point(Wp/Wn) between 2~3 was verified by Hspice simulation.In chapter 4, the generation, propagation and capture probability of single event transient were modeled, the soft error evaluation method based on probability model is also proposed. In transient pulse generation probability model, the critical charge based on linear model estimation is modeled, our proposed model allows to calculate critical chare of a node as a function of the size of the transistors of the driving and fan-out. Intransient pulse propagation probability model, the look-up table method was proposed to estimate the propagation probability l for single gate, l helps to evaluate soft error rate for different gate type, pulse propagation probability reduced with increasing of the number of input port is verified. The pulse acquisition probability model,according to the relation pulse width with propagation delay, pulse propagation model was used to estimate the capture pulse of storage unit, the pulse effect combined with latches effect.In chapter 5, the ISCAS’85 as test circuit, realized the analysis and validation of the model, have verified the transient pulse generate probability decreasing with increasing of critical charge, and showed the exponential relationship. Transient pulse acquisition probability was increasing verified with increasing of the pulse width of the register capture. Finally, soft error rate and basic information of the circuit was gotten, the value of the the soft error rate to lied in order 1E-05, and experience model in the same order of magnitude, so this model is feasible.