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Automotive Smart Power Integrated Circuits, Low-cost Testing Techniques

Posted on:2011-06-15Degree:MasterType:Thesis
Country:ChinaCandidate:X W WangFull Text:PDF
GTID:2208330335997693Subject:Electronics and Communications Engineering
Abstract/Summary:PDF Full Text Request
Following the Automotive electronic fast development, more and more highly integrated high power digital & analogy hybrid integrated circuit are used in product. In the development of Automotive electronic, a lot of high power integrated circuit is used. For ensure the reliability many samples need be tested in stress test items. And they need be tested by ATE. Therefore not only the high power output function but also the digital signal such as diagnosis communication signal need be tested. The IC supplier and even the final product developer must find a lowest cost solution of integrated circuit automatic test. Then they can finish the verification of the IC performance and quality as soon as possible. The test equipment need have highly flexible for suit to different kind of high power digital & analogy hybrid signal.Now normal IC test equipment mainly focuses on analogy integrated circuit and digital integrated circuit. But it is lack of the capability for testing the hybrid signal.This thesis introduces the structure of the whole test system according to the requirement of high power digital & analogy hybrid integrated circuit test. It compares the structure, performance and cost of some test equipment and finally selects the TR6850 test equipment. And then discusses the test method of high power digital & analogy hybrid signal, including switch resource assignment, DC parameters tests, AC parameters tests, function tests and tests based on DSP technology. The test method is used in testing an automotive high power output stage integrated circuit. The DUT have 18 channels load driver for engine control. It describes the problem and solution in the integrated circuit test, including high voltage, big current, SPI communication, time parameter test. And it introduces the hardware circuit and test program making.
Keywords/Search Tags:high power, digital & analogy, integrated circuit test, ATE, Automotive electronic
PDF Full Text Request
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