Font Size: a A A

Digital Integrated Circuit Tester Channel Circuit Design

Posted on:2012-07-04Degree:MasterType:Thesis
Country:ChinaCandidate:Y J HaoFull Text:PDF
GTID:2208330335996368Subject:Measuring and Testing Technology and Instruments
Abstract/Summary:PDF Full Text Request
As the world's second largest semiconductor market, domestic digital integrated circuit industry has made great progress, however, the digital integrated circuit test industry is far behind than the development of the digital integrated circuit industry. The category of domestic digital integrated circuit tester product is limited and the prices are higher, so it is of great importance to develop the economical and practical testers.The functional test unit is made using storage response method and the DC parametric testing unit is made based PMU(Precision Measurement Unit) chip AD5522. Tester has many excellent properties: (1) 10MHz test rate; (2)32 functional testing channels and 4 DC parameter testing channels; (3)the functional testing channel reference level individually configured by groups; (4)formatted clock pluses set separately by pins; (5) highly cost effective.The research content are:1,the development history and trend of integrated circuit tester in the world, and its development situation in our country2,the design principle of functional test and DC parametric test3,the technical route took, the device selection ,devices'functions and the control logic of functional testing unit4,the technical route took, the device selection ,devices'functions and its control logic of the DC parametric testing unit5,Design a testing PCB(PrintedCircuitBoard) and explaining: (1)how to set the parameters in the functional test and DC parametric test; (2) what steps need to be taken ; (3) what points need to be paid attentions in the test equipment...
Keywords/Search Tags:ATE, IC Test, Functional Test, DC parametric test, FPGA
PDF Full Text Request
Related items