Single Event Effects Of Aerospace FPGA And Monitoring Methods

In recent years, field-programmable gate arrays (FPGAs) have being used more and more widely in aerospace applications for the advantages of high integration and programmable. There are mainly three types of FPGA in this field, they are SRAM-based FPGA, Flash-based FPGA and anti-fuse based FPGA. While at the same time, space radiation represented by single event effects (SEEs) make serious threats to the reliability of these FPGAs.This paper developed a research for aerospace FPGAs,SRAM-based FPGA in particular,on single event effects(SEEs). All at first, the basic principle of SEEs and a variety of the formation mechanisms of SEEs were studied. After well known the characteristics of space environment and basis mechanism of kinds of SEEs, a search was developed mainly for the internal structure and the possibility of SEEs in SRAM-based FPGAs. It is found that single-event upset(SEU) and single-event functional interrupt (SEFI) can affect many FPGA modules, and they are very important parts of consideration of devicesAnother key point of this paper is how to monitor the SEEs in FPGA. Through learning a large number of foreigner literatures, this paper summarizes the approaches of the built-in self test, the laser test, heavy ion and proton test. Heavy ion test is one of the closest one to the actual usage, and it is also the domestic method at home and abroad. So this paper also focus on the test data processing methods of the corresponding research in FPGA SEEs ground simulation tests .