Test Configuration Method Research And Automated Implementation Of Application Independent FPGA Interconnect Resource

With the rapid development of advanced semiconductor technology,as well as a variety of electronic design field of the huge demand for FPGA chips,will promote the development of the FPGA industry,FPGA integration will be higher and higher,more and more complex internal resources,more and more powerful features,it is bound to increase the FPGA chip test difficulty.For FPGA manufacturers,FPGA chip factory reliability testing is to ensure that an important guarantee for a chip,the quality of the product determines the credibility and competitiveness of enterprises,so whether to provide users with qualified chips for FPGA chip production Manufacturers is of vital importance.In this paper,by analyzing the advantages and limitations of the existing FPGA test technology,an efficient and common FPGA automatic test configuration method is proposed.The automatic configuration method can solve the problem that more configuration times and complex operation existing in FPGA test technology.The proposed automated configuration method has the advantages of low configuration and high coverage,and is suitable for the test configuration of Virtex full range of FPGA chips,and has strong scalability.Based on the detailed analysis of the full range of FPGA Virtex interconnect resources,combined with the knowledge of graph theory,the paper establishes a general model for the interconnection resource testing,the test model abstract describes the connection relationship between the internal resources of FPGA,which is the fundamental basis of the proposed test configuration algorithm.From the perspective of test configuration,this paper studies the three kinds of interconnected resources of FPGA,and their influence on the automatic configuration method,which provides a practical basis for the automatic configuration of other resource modules.Based on the general test model,the algorithm of finding the distributable path and the node disjoint path is proposed by using the theory of graph theory,the two algorithms can be used to automatically generate all the configuration files,combined with other modules of the automatic configuration of resources to achieve FPGA test configuration graphics automatically generated.In order to prove the feasibility of the configuration algorithm,after the configuration algorithm is implemented by the program,with the help of the FPGA test system developed by the laboratory,the experiment results are verified on the Virtex-5 chip.The experimental results show that the proposed algorithm is in full compliance with the FPGA test requirements.In this paper,compared with the manual configuration,this paper proposes that the FPGA automation test configuration method has high automation and low configuration time,which effectively solves the problem of complicated configuration and high configuration cost.At present,the automatic configuration method has been used in a large scale production test of FPGA by a scientific research institution,and further illustrates the practical application value of this test configuration method.