Research On FPGA Function Test

Field Programmable Gate Array(FPGA),with its flexibility,parallelism and other characteristics,is widely used in various fields such as communication and consumer electronics in modern society.The stability and reliability of its functions are crucial for related systems.Therefore,this paper studies the function testing of FPGA.Based on the FPGA internal circuit structure,this paper analyzes the fault model of the configurable logic block,input/output block,digital signal processor,block-RAM and clock manage modules,and then studies the test methods of each functional module.The principle and response of stuck-at faults,bridge faults,open faults and delay faults in FPGA are analyzed.The internal circuit resources in FPGA are divided into functional blocks and the functional test research is carried out.The configurable logic block test is divided into look-up table function test,register function test and distributed-RAM function test.Input/output block is divided into IDDR function test and ODDR function test.Block-RAM is divided into memory array test,read and write control test,ECC check function test.Digital signal processor is divided into addition function,multiplication function,accumulation function,cascade function and pipeline function test,etc.Finally,UltraFLEX,an automatic test device(ATE),was selected to build the test platform,and the full-resource coverage test circuit of each function test method was designed by Verilog language programming according to the distribution rule of each function module in FPGA.The IG-XL control programming software was used to design test programs for the ATE and create test instances for functional test experiments.On the platform,related experiments have been carried out and the results verify the validity and correctness of this research and the testing methods.