Research And Implementation Of DDR3 STT-MRAM Chip Test

Today,it is a huge data information in terms of artificial intelligence technology.In such a digital age of big data,the importance of data is self-evident.And memory,as the carrier of data storage,plays a vital role.This makes people continue to explore the emerging high-performance memory.Over the years,MRAM memory has attracted people's attention.For traditional SRAM and DRAM,first,SRAM cannot have a large storage capacity within the limited chip volume.And the DRAM is constantly being refreshed during use,so a large amount of energy is consumed during the operation.However,while the access speed of MRAM tends to SRAM,it also has a large storage capacity.And due to its non-volatile,MRAM does not need to be refreshed during use,which greatly reduces the device power consumption.Therefore,the MRAM memory can gradually become an alternative to SRAM and DRAM,and can achieve excellent results.MRAM memory gets more and more applications,which are critical to their tests because it is an important guarantee for its electronic system stability.For different MRAM chips,due to the differences in design,they have different external interfaces and operation modes.Therefore,making the corresponding test scheme and completing the test of each index for different MRAM chips can not only guarantee the reliability of the chip,but also indicate the performance parameters of the chip.This article describes the development processes and basic principles of MRAM,as well as the basic information of the chip EMD3D256M08BS1 to be tested.The corresponding function and parameter test scheme are developed for the chip,and the whole test platform framework structure is designed accordingly.After that,the hardware design and manufacture of the test platform are completed.The test platform designed in this paper takes FPGA as the core and realizes the functional test circuit and parameter test circuit through FPGA.Among them,the functional test circuit needs to have the functions of reading and writing of MRMA chip,test data generation,test address generation,test result comparison,test result display and test control,while the parameter test circuit needs to control the MRAM chip to work in different working states to test different state parameters.According to the corresponding test flow,the function test of MRAM chip is completed,and then the parameter test of MRAM chip is completed with ATE.Analyzing the read and write functions of the MRAM chip and various parameter indicators based on the results of the test.