The Research Of Relative Run Length Coding Method

The rapid development of the integrated circuit industry in recent years has led to a sharp increase in the amount of data in the circuit,while the scale of the chip has been shrinking,which poses challenges to the intelligence and compatibility of the chip,and related tests for the circuit chip,we will encounter a series of complex faults.There are several problems in the chip testing process that need to be addressed: shorten the test time,reduce the test power consumption,and cut down the test data.The current mainstream solution is data compression.The paper describes the development and research status of integrated circuits,the testing principle of circuit chips,the test classification and a series of challenges in the testing process,and describes the data compression methods commonly used in BOST,and introduces them one by one.Coding ideas and coding processes,and combining the specific cases to explore the advantages and disadvantages of each compression method,through the comparison of several compression methods to improve.The traditional method of testing data compression generally encodes the run length directly,and the original test data run length has certain limitations on the encoding.The paper proposes a relative run length coding method,which firstly compares the run length with the median of all run lengths,and then encodes it to reduce the length of the code word by reducing the relative run length.The experimental results of some standard circuits show that the compression method proposed by the paper is better than Golomb code,FDR code and other similar coding schemes,and has good compression effect.This article is the ISCAS standard circuit generated Mintest sets to analyse of test data compression rate,and is programmed on the JAVA-based platform to obtain data compression efficiency.The relative run length coding scheme has a simple hard ware structure,small area overhead,and is easy to operate.