Built-in Self Test Technology Research Of Data Acquisition System

Data acquisition system as the important part of information acquisition, is widely usedin aerospace, national defense military and industrial field, etc. With the rapid development ofinformation science and technology, the requirement of stability and reliability of the dataacquisition system is higher and higher. Built-in self test technology is integrated in theelectronic device, additional auxiliary test circuit implementation of the electronic equipmentfault diagnosis and fault location technique. Built-in self test is applied to the data acquisitionsystem, the data acquisition system can be, online real-time fault diagnosis test, to improvethe stability and reliability of data acquisition system is of great significance.First, this paper introduces the basic structure of the circuit. Based on the basic parts of adata acquisition system, the general structure of built-in self test designs and the modelingstrategy of built-in self test are proposed for analog and mixed signal circuits of dataacquisition system. On this basis, The test excitation signal of data acquisition system isanalyzed, and an improved method of the built-in test excitation signal generating is proposed.This method moves Σ-Δ modulator in the digital oscillator and uses data selector and shiftoperation instead of multiplication. As a result it reduces the hardware overhead of excitationsignal generating circuit.Aiming at the shortcoming that the method of traditional analogcircuit built-in self test occupys a large amount of circuit resources, a method of analogcircuit built-in self test based on square wave excitation and fault dictionary is proposed.Square wave signal is used as test excitation and fault dictionary is used to identify the faultstate. It reduces the hardware overhead. The static and dynamic parameters of ADC built-inself test technology is researched. An improved method of ADC built-in self test wasproposed. The method uses the related sampling technology and window function, to reduce the spectrum leakage. At the same time, the static and dynamic parameters of ADC test areput together. And it makes full use of the FFT analysis, so it can only use the same structureto obtain the static and dynamic parameters ofADC.Finally, the experimental is made for the proposed methods. The results show that theproposed method is feasible.