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Research And Implementation Of Chip Automatic Test Platform Based On FPGA

Posted on:2014-10-20Degree:MasterType:Thesis
Country:ChinaCandidate:X N FangFull Text:PDF
GTID:2268330425476890Subject:IC Engineering
Abstract/Summary:PDF Full Text Request
With the development of semiconductor technology, complexity and integration ofintegrated circuit products increasing,chip verification is becoming increasingly difficult, butalso more time consuming. Research and development of chip testing tools becomes aresearch hotspot.This paper researches and develops four tools,i2c test tool, CRG test tool, clock phaseshifter and phase detection tool, and use a innovative way to put them in a test platform bylocalbus bus. This device can tests a variety of chips with i2c interface.The testing coveragefor i2c protocol can reach more than95percent that help solve the i2c bus interface chip withlow test coverage problem.To solve the problems of whether or not clock and decompressiontime reset is dependent, reset width is too small and homologous clock phase is stable.Thisequipment supports the relationship test between clock and reset signal and multiple clocksphase. This equipment not only can control the clock signal and reset signal respectively, butalso can control reset signal and clock signal together, phase accuracy can be achievedpicoseconds. In addition, the device supports provide any clock phase and frequency of notmore than200M which solves the problem that some of the chip testing phase requires anexternal clock to make the chip work. All tests can be configured through the tcl script, canalso be flexibly configured through the PC, the test results can be automatically recorded. Inthis paper, the design of the main structure of the processor and FPGA programmable logicdevices can be extended on more features in the future according to needs.By actual chip test show that test equipment satisfy design requirements. This equipmenthave a certain usefulness, worthy of promotion and application with high integration, testcases complete good, easy upgrade and expansion, high degree of automation.
Keywords/Search Tags:I2c, Chip, Test Equipment, FPGA
PDF Full Text Request
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