The Function Test System Of New Digital Micromirror Chip Based On FPGA

The increase in the scale of integrated circuits and operating frequency has made the testing of integrated circuit chips more difficult,and the demand of integrated circuit test equipment with high performance and automation has arisen in the meantime.However,the test instruments in the market are expensive and lack in automation to meet the various test demand.And there are few customizable test platforms for specialized chips.In response to the needs of the project assigned by a Japanese company,the author designed a new FPGA-based digital micromirror chip function test system,which aims to provide an automated test platform for integrated circuit chips,reduce the cost of repeated tests,and improve the control capabilities of chip manufacturing and productivity.The hardware platform developed in this paper is composed of a 10-layer test driver board and a 6-layer test daughter board,which contains a total of 1271 components and 4130 connected networks.The driver board uses the ZYNQ series system-on-chip integrated FPGA+ARM architecture as the core processor and the MCU as the auxiliary controller.It is equipped with peripherals such as video processors,DDR3 SDRAM and high-speed LVDS interfaces.The daughter board only serves as the carrier of the chip under test and provides the necessary basic peripherals.In the design process,with the help of simulation tools and rigorous theoretical calculations,this paper realizes the optimization of the hardware design of the system from three aspects of signal integrity,power integrity and electromagnetic compatibility.At the same time,this paper combines the above hardware platform with selfdeveloped software system to realize the functional test of the new digital micromirror chip.The FPGA software uses the digital RTL design of the FPGA to implement the function test and chip driver;the software design of the MCU consists of data transmission and system configuration;the design of the system operation interface provides a visual test interface,which is connected with a database to support the storage and indexing of test data,providing data basis for subsequent analysis.The FPGA-based chip function test system designed in this paper takes the new digital micromirror chip as the main test object,and fully considers the compatibility with other integrated circuit chips' test.The highly reconfigurability of FPGA enables the system to customize the corresponding test content for different test needs,and provides solutions for chip design verification,product inspection,and field maintenance.All the merits mentioned above bring this test system with broad application prospects and practical significance.