Research And Realization On The Generating Method Of Test Vectors Of Micro-Controler

At first,this paper introduced integrated circuit development and the development and importance of the IC automatic test technology.IC testing developed with the development of integrated circuits, and was processed in the entire IC development stages,including IC design stage, IC manufacturing stage and IC application stage. As China's IC industry started relatively late, and failed behind the developed country,that leaded to the development of China's IC testing industry starting later. The research of domestic IC automatic testing equipment(ATE) began in the 1970s,and made great progress in the 1980s, but there were a lot of things need to further resolve such as research Senior IC ATE and the test theory and related issues.Digital IC test content includes logic functional test, test of DC parameters and test of AC parameters. The logic functional test is introduced in the paper, including the testing principles and hardware framework;two test ways(FVMI and FIMV) of DC parameters test was analysed.Domestically, the IC test before using has been put more importance on,and in a military unit there has formed a strict acceptance test standards.But the user-level test is still subject to a lot of restrictions,especially in the test of LSI, such as micro-processors and micro-controllers.As the result of these devices's relatively more complex internal structure and the unkown of the gate-level schematic,how to efficiently develope the test program and generate the test vectors became a major problem.Through research and feasibility studies, by construct the fault models of functional level, test microprocessors, micro controllers instructions system is known as one of the most effective methods.That is to say,by preparing the testing assembler and making a micro-processors or a micro-controller under test operate the setted testing programs, and checking the state of data pins will achieve the test purposes. The process of inverting test assembly to the test vectors is a very difficult task.In light of this situation, the paper used learning method to realize efficiently automatic generating test vectors, that greatly increased the efficiency of developing test programs and test vectors of micro-processors and micro-controllers. But learning method need something necessary to support,including hardware structures and function of ATE itself, specific circuit the device need and so on.So the paper systemically introduced the principles and hardware design of the learning"method,including structures,timing setting,driving/comparing circuit,writing test vectors and pattern file compiling in reverse and so on.Take the N80C196KB as an example, the paper seperately complete the test of instruction system,timers,A/D converter by using learning method.The successful application of the learning method will highly improve the productivity of test program generating of micro-processors and micro-controllers ,and supply some recommendations and informations to national counterparts on the field of researching and developing high-performance integrated circuits ATE about the hardware design framework and test theoretics.