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Low Speed And Small Scale Digital/analog Hybrid Integrated Circuit Testing Board Design

Posted on:2016-03-19Degree:MasterType:Thesis
Country:ChinaCandidate:D LiuFull Text:PDF
GTID:2308330482465995Subject:Integrated circuit engineering
Abstract/Summary:PDF Full Text Request
With the development of electronic technology, IC has been an integral part of our daily life things. So the study of the integrated circuit is now as well future a hot issue research. The integrated circuit testing is the study of hybrid integrated circuit key areas.This paper is a design of low speed and small scale hybrid integrated circuit board. The main content is based on the existing functional chip, using the modular design ideas, design a high reliability of IC testing board. The test board can meet the test requirements of the low speed and small scale hybrid integrated circuit. Compared with the common IC testing instrument in the market, it has the advantages of simple operation, low cost and high practicability.This paper describes the development process of IC test technology, the industry development trend at home and abroad and hybrid integrated circuit test principle and related technologies. Awe used the circuit board designed in this paper to experiment the static parameters of a DAC chip and verify the functions of the test board.
Keywords/Search Tags:Hybrid integrated circuit testing, Static parameters test, DAC, signal capture
PDF Full Text Request
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