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Research And Performance Analysis Of The Test Program Of High-precision ΣΔADC

Posted on:2014-06-24Degree:MasterType:Thesis
Country:ChinaCandidate:W Q SongFull Text:PDF
GTID:2268330401966962Subject:Electronic and communication engineering
Abstract/Summary:PDF Full Text Request
Modern communication systems, network transmission systems, computermulti-media system design of digital systems are leap and bound. The interface betweenthe analog and digital circuits that ADC speed and accuracy as the key to future digitalsystem flourish and bottleneck.The corresponding high-precision ADC performance testand functional verification program requirements are also rised, and has been graduallyupgraded to a need to acquire the important technical obstacles blocking of ITinnovation.Firstly, ramp voltage test method and column chart test method are brieflydescribed, a comprehensive analysis of the dynamic test principles and techniques andthe architecture of the ADC data transmission also described. On ΣΔADC the basicprinciple, the performance index, the test ports and the chip package made profiles,more detailed analysis of the definition of the parameters used in commonly test.Further study the test program, by the interference of the signal source in the clockjitter effect precision ADC and the digital circuit system as well as its own frequencyaccuracy in the measurement of the precision ADC on the time domain sampling signal,the corresponding discrete Fourier transform is an applied method and high stability,low noise voltage source is necessary. It also discusses the different window functionwindow function processing technology for the effect of different treatment to solute thespectral leakage problem.Finally, a high-precision signal source is used to build a performance test platformand functional verification system. The same clock as the core of an FPGA flexibility tobuild software and hardware test platform to complete each part of the system debugand data process, and the design requirements of static parameters, dynamic parametersof the measurement and analysis are compared with them according to simulationresults.In the test program verification system and research program, the actual resultsshow that key indicators in accordance with precision ADC test validation features, the test method’s flexibility, integrity, programmability and versatility are better, themeasured precision ADC chip, has been tested and can be applied to moderninformation and communication systems, lays its future large-scale application basis.
Keywords/Search Tags:ADC chip, Static test, Dynamic test, Functional verification
PDF Full Text Request
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