Hybrid Platform Development Base On ADVANTEST

As most important part of digital circuit system, the Memory IC need be tested very rigorous during production. Different memory type has different structure and different working module, need different test methodology. All test items are produced by test program, so we need test program has good test coverage while continues reduce test time, improve test efficiency. Good test platform can make the test program development more flexible, and can help test engineer develop and maintain test program more easily.This paper focus on Memory IC test methodology, develop hybrid platform for memory IC testing on ADVANTEST tester. Detail introduces hybrid platform structure, product tape sharing, test template and user menu function. Base on PSRAM, introduce the test program development using hybrid platform, compare with old platform, it's more flexible and faster, and easier for test program maintain and upgrade.