Characteristic And Testing Methodology Of See Soft Error Propagation In SRAM-based FPGA

With the rapid development of modern spacecraft, SRAM-based FPGA is adopted to applicate in space due to its excellent performance and programable advantage, however, Single Event Effect (SEE) is tough bottle-neck. In recent years, with device feature size shrinking and fast rising frequency ranges, SEE is becoming more complicated: SEE error is propagating in the logic circuit, affecting the interrelated area and even resuting the failure of circuit function.The thesis focuses on the modeling and testing methodology of SEE soft error propagation in application level, studies the effect of interrelated module and output of specific circuit induced by SEE soft error. The main content researched is as below:(1) According to the feature of SEE, starting off the structure model and sensitive unit of SRAM-based FPGA, soft error propagation is analysed and the science meaning is stated, the content includes coupling factor of function module, error propagation model and soft error failure rate.(2) According to the propagation of SEE soft error, the simulation method is proposed to study it. Aiming at the dynamic propagation progress, SEE soft error propagation simulation model which is based on Cellular Automaton is established. The algorithm is researched and carried out, simulation result is analysed and the effect factor is discussed.(3) Aiming at researching the content of SEE soft error in SRAM-based FPGA, method of coupling factor of function module and soft error failure rate is analysed and SEU fault injection system is introducd. The principle and algorithm of SEU fault injection, experiment system and flow is studied.At last, the soft error failure rate of the International Symposium of Circuits and Systems in 1985 and 1989 (ISCASA'85 and ISCASA'89), is tested by the SEU fault injection system. And coupling factor of function module is calculated.The experiment shows that the testing data accordants with the SEE soft error propagation model, and the test results were constructive for improving designs to space application. The meaning of the research is to enlarge the comprehendment of SEE soft error propagation in SRAM-based FPGA, and provide material to mitigate the SEE for such device in radiation environment.