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Soft Error Of Single Event Effect Propagation Reserarch In Circuit

Posted on:2015-05-08Degree:MasterType:Thesis
Country:ChinaCandidate:S K LiuFull Text:PDF
GTID:2322330509460592Subject:Instrument Science and Technology
Abstract/Summary:PDF Full Text Request
The energetic particles in the space radiation environment will make the electronic devices in the spacecraft occurrence of single event effect, seriously affect the reliability of the operation of the spacecraft in orbit, so the study on the the single event effect is one of the main research directions in the field of circuit reliability.With the increasing integration of the circuit, soft errors caused by single event effects affect the spacecraft gradually become the main reason for the normal function of the circuit.For the main problems of soft errors how to spread and eventually affect the output of the circuit,this paper addresses the following three key problems:1.The factors would influence the spread of soft errors in the circuit of the single event effect.This paper systematically analyzes the influence factors of soft errors propagating in the circuit, analyses the mechanism of various factors affecting soft errors propagating, and has done experiment in Beijing HI-13, for validating and exploring some factors of the analysis in this paper.2.The theory problem of single event soft errors propagating in the circuit.Based on the analysis of single event soft errors propagating mechanism,modeling the propagation of soft errors in the circuit.First of all, the six group soft errors propagating model is put forward, soft errors can be described, soft errors propagating behavior model theory was enriched and expanded.On this basis, the reconvegence effect of soft errors in the circuit are described in this paper, and a method to describe the reconvegence based on logical unit was put forward, it can offer a new idea for themodeling and Simulation of convergence. This paper also describes logic shield in the circuit, proposing a node probability algorithm, through the calculation the value probability of each node in the circuit in advanced, as prior knowledge to rapid assessment of soft error quantization, it can be applied in high speed computing environment.3.Quantitative circuit soft error propagating problem.According to the node probability algorithm of soft errors quantified designassessment software, considering the logical shield and electrical shield effect factors on the combinational logic circuit, for the soft error rate of rapid assessment and compare with foreign papers, this method is reasonable.
Keywords/Search Tags:Soft Error, Propagation, Heavy Ion Experiment, Logic Shield, Soft Error Rate(SER)
PDF Full Text Request
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