Single-event Effects In 28nm SRAM-based FPGA

SRAM-based FPGAs have been widely used in the aerospace industry due to their programmable flexibility and high performance,but SRAM-based FPGAs are highly susceptible to single-event effects due to their special structure.With the reduction in the feature size of the FPGA,the effect of the singleevent effect becomes more apparent.In this paper,the single-event effect on 28 nm FPGA has been investigated systematically.The main contents are as follows:1)This paper determines the single-event effect test method and designs a 28 nm FPGA singleevent effect test system.The cross section of configuration memory and the block memory in FPGA can be obtained and the function error can be tested with this platform.Also,single-event latchup can be tested by supervising the current.Meanwhile,the pulsed laser platform was used to test SEU on 28 nm FPGA to verify the reliability of the system;2)The bitstream of the XC7K70 T has been resolved by partial reconfiguration which help us understand the single-event effect on the FPGA better.Then,both the correspondence between and the correspondence between the number of frames and resources are concluded.the meaning of the commands in the bitstream3)In this paper,the SEU of 28 nm FPGA have been tested with the proposed test system.The experiment indicate that 28 nm FPGAs are very sensitive and generate large number of functional errors under the high LET heavy ions.The experiment also showed that low-energy protons can cause singleevent effect of 28-nm FPGA by direct ionization,and the MBU also observed in the low-energy proton experiment.By comparing the experimental results of low-energy protons and high-energy protons,it can be seen that the sensitivities of different resources in FPGA are different.4)The fault injection platform is completed with the resolved information of the bitstream.There are three injection modes in the fault injection platform,that is,global injection,single-bit injection and random injection.Wherein,the results of the global injection are the most accurate due to the bit-by-bit injection,which means that global injection need more time to complete fault injection.However,random injection can save the injection time.Therefore,with the fault injection platform,the equivalence of global injection and random injection is verified.And this fault injection platform is used to test the sensitive factor of different circuits designed in 28 nm FPGA.Also,the effectiveness of the partial TMR for the sensitive resources is detected by random injection.The work designed the test system and the methods.Also,the fault injection platform was completed.Then SEU in 28 nm FPGA can be induced by low-energy protons was observed.These works are the basis of the subsequent researches.