High-speed Adc Dynamic Testing Devices

With today's electronic information technology developing rapidly, ADC's,as digital and analog interface circuit,are also getting continuous development towards the direction of high-speed high-precision. This trend is accompanied with the growing demands for its testing methods and means. As a result of its high-speed high-precision's characteristics, in the actual application, the factors such as driving, clock,grounding,bypass and power will lead to a more serious lowering of the performance parameters than to the common ADC's, thereby making its evaluation become more difficult. Simultaneously because the overseas developed countries have been keeping to China implementing high-speed high-precision ADC restrictions on the export licence system (for ADC's of eight bits, speed limited to less than 500 MHz; for 10 bits ones, speed less than 200 MHz;and more bits, more strictly will be the limited), so it is quite difficult to access the advanced ADC test technology. Therefore, the effective research and exploration of high-precision high-speed ADC dynamic testing technology is of great practical significance.By selecting the high-speed high-precision ADC sampling - ADI company's 10 Bit, 40Msps pipeline ADC AD9203, referring to foreign ADC evaluation board design experience, making a careful study of the matching relationship between different parts, A variety of components required for the evaluation board were selected and the purchased with evaluation board schematics mapped out at the same time. After a detailed discussion of the various issues which should be considered in high-speed PCB design, and through the use of the appropriate place and route, the layout diagram of AD9203 evaluation board was drawn and the prototype board was fabricated with all component welded on it later. Finally based on the designed AD9203 evaluation board and the existing laboratory equipment, an ADC test platform was built to evaluation chip performance. Then by developing the test plan, the chip test has been carried on. By above, thus a effective way for high-precision high-speed ADC testing technology has been explored and studied.Main content and results include the following two aspects. 1.A detailed description about the basic performance parameters of ADC's dynamic parameters was given respectively, and the main testing methods—the fast Fourier transform test method was also introduced.It was identified the main circuit composition module of an ADC Evaluation Board .The mutual match relations between each main module like driving or clock circuit and performance parameters of ADC was analyzed.After that, according to the theory above, primary components and devices were selected with AD9203 evaluation board schematic diagram being drawn using Protell99se.2. After taking fully into account of the integrity of the electromagnetic (EMI), signal integrity (SI), and power integrity (PI), a detailed research was carried on the place and route of ADC evaluation board. Then the AD9203 Evaluation Board was designed,fabricated and welded.The vital composition modules and their performance parameters of an ADC test system is clearly.Then the test system was built up, which has taken the performance parameters of AD9203 under the condition of existing laboratory.It is shown that the entirely feasibility of designing and constrcting an ADC dynamic test system.