Design Of High-speed High-precision ADC Test System Based On The Digital Signal Processing

With the development of radar, high speed data processing and high speed datacollection, the speed and precision of analog-digital converter also improve with a highspeed.When we use ADC at the situation with high speed and high precision, theanalysis and test of parameters’ performance are particularly important.This paper realized a ADC testing method based on FPGA and digital signalprocessing,which means in the way of the digital signal processing.Through FFT, thesignal of ADC will be changed to the frequency domain, and through the analysis andcalculation,the dynamic performance parameters can be obtained.This paper introducesthe high frequency of the analog signal transmission and matching method, and basedon FPGA and VerilogHDL,we make a discussion about a high speed digital signal’scapture,high speed data storage technology and high speed USB transmissiontechnology,then a overall design scheme of ADC test system is put forward.In the foundation of the research of low noise high-speed circuit designtechnology and according to the function of the test system ADC, this paper design thehigh bandwidth ADC supportting module, high speed data acquisition module, lownoise clock module, MCU control circuit and the power modules.Aslo it make effortson the high speed system circuit board design,the processing method of EMI/EMC,and PCB of the ADC testing system.Through the design about FPGA building datainput to the SRAM data access, FPGA and communication of MCU,and establishingthe communication from the SRAM USB chip to the path of data,USB interface of theprogram firmware design was completed,and data and PC’s high-speed transmissionwere realized successfully.In PC parts, Matlab was used,and the test of ADC digitalsignal processing and frequency domain analysis algorithm have been completedsuccessfully.After a comparation with a known performance parameters of the ADC chip forthe ADC AD9445as a determinand and with the chip known performanceparameters,we can draw a conclusion that the ADC test system,which was described bythe paper,has a high level correctness and feasibility.In addition,this method fordynamic performance parameters test of ADC has a good application value.