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Normal Channel Signal Processing And Automatic Test

Posted on:2008-05-01Degree:MasterType:Thesis
Country:ChinaCandidate:W J HuangFull Text:PDF
GTID:2178360272478085Subject:Signal and Information Processing
Abstract/Summary:PDF Full Text Request
The work studies a radar signal processor module, the paper particularly introduces some important functions of the hardware of the module, they are dynamic clutter maps, static clutter maps, supper clutter maps, automatic plus control and anti-asynchronous interfere and so on. The hardware is tested as a frame of reference on some military's automatic test equipment, called Spectrum 9100 of TERADYNE company, on the platform of the automatic test equipment we can achieve some useful jobs, it is used to detect the fault hardware and orient the fault on the source of the chips, the signal processing hardware is a highly integrate circuit, and the architecture of the hardware is also very complicated, however, exploiting test program and application will shorten the repair time for technicians, which is very important for radar's natural working.The article introduces a fault detection method of combining software simulation and function test, and also introduces the hardware of automatic test system of Spectrum 9100, and discussed how to realize the method based on the automatic test system, and then generating the software diagnostics database, after that we put the signal processing hardware on the automatic test platform, on the platform we also use the software of TestStuidio to compare the processing result of the hardware to software diagnostics database ,with the help of probe guide we can trace back from the failing output to the node of chip which is the source of the fault, and the fault coverage is also achieved as required over 80 percent.
Keywords/Search Tags:Clutter map, automatic test, fault detect, FPGA
PDF Full Text Request
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