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Research On Simulation For Radar Clutter And Automatic Test Method For Circuit Board

Posted on:2008-03-28Degree:MasterType:Thesis
Country:ChinaCandidate:H F ShenFull Text:PDF
GTID:2178360272478094Subject:Signal and Information Processing
Abstract/Summary:PDF Full Text Request
In the research and development of radar system, it is necessary to experiment on the radar prototype in order to test the performance of radar system. But the fact is that it is difficult to get real information of radar echo sometimes, and then the establishment of a radar operating-environment model is required. Thus it is very important to study the characteristics of radar environment and simulate of those data.The analysis of radar operating-environment and studies of its characteristics are done in this paper mostly. Several typical radar clutter models of correlated Non-Gaussian distribution are analyzed by the simulation method that is applied abroad at present. In order to model the radar operating-environment more exactly, a set of real echo data is analyzed in the paper. And a strict maximum entropy spectral estimation method based on recursive algorithm is presented. Its estimation results are more exact and the method is simple and feasible. Combined with a practical project, a signal source is designed, including a digital one and an analog one. All kinds of simulating radar environment data and the real echo data are adopted in the digital signal source. It provides a basic hardware requirement for the test of performance of radar system and the practice proves the validity of this digital signal source.Along with the integration and complexity of circuit boards being more and more high, realization of automatic test for these circuit boards is important to perfect repair measure and improve repair efficiency. The structure, development status and development trend of automatic test system and the flow and method of fault diagnoses are presented in this paper. America TERADYNE Spectrum automatic test equipment and its test flow are stressed. Elementary automatic test for analog signal source on M9100 is achieved.
Keywords/Search Tags:Correlated Clutter, Power Spectrum Estimation, CPLD, Signal Source, Automatic Test Equipment
PDF Full Text Request
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