| Technology of integrated circuit design, manufacturing and testing is identifiedas three key technologies of integrated circuit technology. With the development oflarge-scale integrated circuit, package of integrated circuit became smaller, functionbecame more intelligent, and logical became more complex. So each semiconductorcompanies have to face the problem about integrated circuit testing.This paper design an automation test system which used in laboratory ofSemiconductor Company, which is based on the test requirements of a famous foreignsemiconductor company. It mainly foucs on two aspects of the integrated circuit testwhich include function test and performance test for new chip products. According tothe characteristics of the performance testing of integrated circuits, this paper usedthe upper machine control GPIB to control test standard signal equipment, and FPGAcontrol matrix switch to signal input by testing device access, which realize theautomatic testing system of high precision and low error performance testing. Aim toATPG algorithm’s directly influences the quality of test pattern and test waveformtesting time and testing precision of the problem, in this paper, the research onintegrated circuit testing algorithm mainly reflects in the intelligent algorithmcombined with classic ATPG algorithm, and raised a novel algorithm for dynamiccompression, which is multi-target test generation dynamic compression algorithmbased on SAT. This algorithm was proved that an ATPG problem is can be turn to aSAT problem. And what is important is that it reduces the test vector generationrunning time and improves the test vector compression ratio. This design completed atiming format converter kernel that it just put the ATPG test vector stored into theDDR3memory, and then driven DCL to convert test vector to waveform directly,which is complete functional testing.Finally, the functional testing and performance testing are meeting the premisethat this article introduces the process of automatic test system design. And then weused this test system to test a new Class D audio amplifier. Test results show that thesystem has stable performance and high test precision, particularly solving theconflict problems between fault coverage and test vector running time. This system iseasy to upgrade and operation, and more important is shorten the development cycleof IC design. It also can test a variety of integrated circuit beside audio amplifier, which has great practicability and popularization. |
