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Computer Hardware Circuit Design For Testability And Automatic Test

Posted on:2004-01-05Degree:MasterType:Thesis
Country:ChinaCandidate:J CaiFull Text:PDF
GTID:2208360095950937Subject:Computer applications
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Along with the Development of the aeronautical electronics system, Reliability and maintainability have become the important targets of technique capability of aeronautical electronics products. Test has been important step in the procedure of design and production of embedded computers which are loaded on aeroplane. With the development of testability technology, Test and computers design have merged into together. Test's methods change and inprovement continuously, automatic test is becoming main method in electronics products' test. At the situation, my institute wants to develop General-Purposed Automatic Test Equipment, which is used for testing our embedded computer products, this dissertation is discuss about this research item , The main contributions in this dissertation are given below.By analyzing the testabilitily of a embedded computer system with the testability design rules in engineering practice, we've completed total test schema of the computer system.Aiming at the development of the automatic test technique, especially VXI Bus Test Platform Technique, we've chosen the SR2510 of the interface company as the main test module and completed integration and configuration of general-purposed automatic test equipment with other stimulus, collection measurement and Relay Multiplexer module.According to The test requirements and the signature of the embedded computer, I use special methods and procedures for each module and the whole machine , then complete the test programs.Quantitative analysis of this test is done , we calculate performance parameter of the test, that is fault- examined rate and fault- insulated rate and then evaluate them. At last some suggest would be given for methods to improvement test performance and maintainability.The main work that I' ve done in the dissertation is: Participating the design of the total test scheme, Designing by myself the adapter for testing the modules of a computer, Completing test programs. The most important and difficult things in the dissertation is the programs for testing memory by automatic test equipment.With the General-Purpose Automatic Test Equipment developed by outself, our automatic test capbility is improved rapidly The test andmaintenance of our products are regular,and the techniques will be keeping up with those of advanced countries.
Keywords/Search Tags:Design-For-Testability, Built-in Self-Test, Boundary Scan, Functional Test, Fault- Examined Rate, Fault- Insulated Rate, Automatic Test Equipment.
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