Boundary-Scan Based Built-in-Self-Test Technology And Its Application

Boundary-Scan-based Built-in-Self-Test technology is widely used for digital system,board level,and IC manufacturing test applications.It is important for reducing the cost of the entire product life cycle,not just the production phase.With the development of IC density and the technology of manufacturing,it is posible for packaging all the necessary electronic circuits and parts for a "system" on a single integrated circuit,digital system has came into the age of System-On-Chip.Meanwhile the testing of SOC become more difficult and complex,Boundary-Scan-based Built-in-Test technology give a new solution. This Thesis construe the fundamental principle of Boundary-Scan test technology and the IEEE Std 1149.1,implement one embedded Boundary-Scan Built-in-self-Test model that is based on the microprocessor,and can be used for On-Line testing.To meet the need of reliability in hardware for the embedded-tracking system,use the embedded test model to enhance the reliability and testability of the entire tracking system, realize the function of fault detection and troubleshooting,fault tolerance and redundance,system resume.The embedded tracking system include the Nios processor system,image sample/display model and communication model.The tracking system is implemented at Altera FPGA development kit,and use the Niso processor to complete the tracking algorithm.The embedded test model has Avalon-bus interface,FIFO interface,CRC model,and use them to exchange information with Nios processor to finish the testing function.The tesing model can communicate with the master-control program through the JTAG and parallel port,the master-control program take responsibility for controlling the working of the test model,reading in and out the test data. The embedded test model can work at the control of the master-control program,and also complete the Built-in-Self-Test with the Nios processor and the program in the embedded RAM on the FPGA. This Thesis use the embedded Boundary-Scan Built-in-Self-Test model to solve the testing problem of the embedded-tracking system.The result of the experiment indicate that the test model can complete the predefined testing function,and it is useful for the SOC testing problem...