Design And Development Of IC Test System Based On System Board And Handler

The integrated circuit industry has ushered in a period of great development after entering the 21 st century.Correspondingly,chip verification and testing have become key steps that cannot be missed in the design and development of integrated circuit systems.The general solution to the test system is generally to use Automated Test Equipment(ATE)that matches the chip.As the cost of the test system continues to rise,the manufacturing and use costs of ATE are also rising.The increase in circuit complexity and the rapid increase in the amount of chip data have led to a sharp increase in test time and a sharp increase in the cost of test development.The design and research goal of this paper is to develop a new test system based on self-developed system board,which can be compatible with Synax Sx2400 manipulator for efficient and low-cost testing of chips.The test scope includes the function test of the chip and the test of electrical performance parameters.On this basis,through the design and debugging of the system board,the effect of shortening time,reducing cost,and saving energy consumption can be achieved.Finally,a set of chip test system with reliable function and controllable test is realized.The main research results of the thesis are as follows:(1)Introduced the basic components of the integrated circuit test system,as well as the process and basic principles of integrated circuit test items.Based on the description of the above principles and analysis of the requirements for the specific improvement direction of the integrated circuit test system,the basic improvement direction and prospects of this design are described,that is,the test machine is replaced by the self-designed system board,and the manipulator is used to replace the manual.Use software programming to improve system automation and modularization level.According to the proposed technical requirements,the signal integrity principle of PCB drawing is described.(2)The overall structure of the test system was designed and built programmatically,the schematic drawing and board drawing of the PCB system board were drawn,and the process and technology of the board casting and welding of the system board were briefly introduced.Built and integrated the integrated circuit test system designed this time,briefly introduced the design and construction of the communication module of this type of integrated circuit test system,introduced the realization of signal communication between the system board and the manipulator,and introduced the manipulator and the test system to be tested.Made a brief introduction of the realization of the communication between system board and handler.(3)Describe the test of a Flash chip in the test system designed this time.First,this chapter introduces some parameters of the Flash chip to be tested,and then briefly introduces the design of the test daughter board,and then describes the test process and method,including DC parameter test and functional test,etc.,and the test results and test The failure causes were summarized and analyzed,and finally,opinions on the performance of the test system and some exposed problems were put forward.Compared with the traditional ATE machine,the test efficiency of the test system has been improved by 100%.Since this design verification has carried out a simulated two-chip parallel test,the maximum three-chip parallel test without the test system design has been carried out.It can be considered that in the follow-up In the application of the test system,the test efficiency will be increased by 200% according to the traditional ATE test.The test and development system designed this time has been greatly improved compared with the general integrated circuit test and development system.It provides a way of thinking for the development of the subsequent integrated circuit test and development industry,and has accumulated experience for subsequent development.The system has entered the actual test development process.In the future work,the improvement of this system will continue.