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A Design Of Automatic Monitoring Software For Build-in Test Module

Posted on:2022-02-09Degree:MasterType:Thesis
Country:ChinaCandidate:Y K XuFull Text:PDF
GTID:2518306524988449Subject:Master of Engineering
Abstract/Summary:PDF Full Text Request
BIT stands for build-in test.It is a mechanism that allows the device to perform selftesting,and it is also an implementation technology for testability design.The purpose of the build-in self-test system is to simplify the complexity of product testing,thereby reducing costs,and at the same time reducing the dependence on external test equipments.With the increasing application scope and complexity of BIT technology,the automatic monitoring of BIT can further improve test efficiency and save resources.This thesis takes communication equipment as the embedded test object,which includes radio frequency signal measurement module,intermediate frequency signal measurement module,analog signal measurement module and digital chip measurement module.Then,this thesis designs an automatic monitoring software system,which is divided into three parts,namely the analog signal test module,the digital chip boundary scan test and fault diagnosis module,and the background data storage display module.The analog signal test module can control the BITE hardware system according to the commands set by the user in advance,to measure and display radio frequency and radio frequency power,intermediate frequency AM modulation signals,FM modulation signals,and the 8-channel low-frequency analog voltage signals.And the digital chip boundary scan test and fault diagnosis module of the System completes the reading and analysis of BSDL files,the reading and analysis of netlist files,the generation of digital chip test vectors and the chip fault diagnosis,and then the fault diagnosis test of each digital chip and the instruction execution result will be displayed graphically.Among them,for the digital chip test and fault diagnosis module,this thesis discusses the four algorithms of digital chip test vector generation,which are the step "1" algorithm,the improved counting sequence algorithm(MCSA algorithm),the equal weight algorithm and the network group shift Algorithms.In addition,this thesis studies the above four algorithms from the perspective of the compactness and execution efficiency of the generated test vectors.The function of the background data storage and display module is to store the data generated by the four test modules during the monitoring process;at the same time,the user can also set the filter parameters of the corresponding test modules through the page to retrieve the monitoring data,and then realize the backtracking of the monitoring data.After building the three major modules of the software system mentioned in the previous thesis,this thesis also designed and implemented the BITE hardware platform automatic verification module,and completed the automatic verification of the BITE hardware platform through this module.Finally,this thesis has tested this system on the BITE hardware platform that has been built,which realizes the automatic monitoring of the entire BITE module,and each automatic monitoring module can work normally.In addition,this automatic test background system can also completely record the data generated during the automatic monitoring process,achieved the expected effect of the automatic monitoring software system of the Build-in Test module.
Keywords/Search Tags:Build-in Test, automatic monitoring, BSDL, boundary scan
PDF Full Text Request
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