The Edge Of The Network Scan Test Controller Developed With The System Set Up

With development in deep submicron IC technology, many or all system functions can already be packed into one single chip. At the same time, higher chip integration and PCB assembly density will make external pins much inaccessible and test of IC and PCB much difficult. It is possible that the cost of chip test is higher than that of its design and production. Boundary-scan Test (BST), as one of Design For Testability (DFT) technology that inserts DFT into silicon chips, supports test at all hierarchy level such as system, board and chip level etc. BST technology provides one standard test port and architecture for IC design for test. The device and its external circuits can be tested through boundary-scan register (BSR) that exists between I/O pins and system core logic, and these have been standardized. The corresponding international standard is IEEE 1149.1.With the information technology developing, the test technology has been improved by people widely. It should be achieved that the information and resource of instrument can be shared and the instrument can be controlled from distance. In other words, test through network should be realized. It will make BST technology more practical to make network and BST unite to construct BST test system based on network.In this dissertation, Ethernet BST controller which can be connetcted to Ethernet is designed using embedded technology and can be used in the testing of devices, boards, or systems compliant with the IEEE 1149.1 standard. Software interface designed independently using C++ includes dll which can control the BST controller and BST class which can automatically identifying the files of Boundary-scan description language (BSDL). The circuit board with four boundary-scan link is designed as the tested target. Finally, BST test system based on network is constructed by using Ethernet BST controller, software interface and test algorithm software for the tested target. Identifying each component, boundary-scan link test, circuit board interconnecting test (open and short fault test) and in-test have been achieved.In this dissertation, firstly, the background and significance about BST test system...