Design Of A Backplane Module For An Integrated Circuit Tester

With the continuous development of the integrated circuit industry,the pin and speed of integrated circuit chip has increased dramatically,higher accuracy requirements have been raised on integrated circuit test equipment.As an important part of the integrated circuit industry,integrated circuit testing requires more accuracy on integrated circuit testing equipment.In the field of integrated circuit testing,the current domestic development status still has a certain degree of comparison with foreign technical levels.Therefore,the research on integrated circuit test technology and the design and development of high-end integrated circuit test equipment have important strategic significance in the current world situation.In integrated circuit testing,the data transmission rate of the integrated circuit test equipment directly affects the test results of the chip under test,and the current universal PCI communication bus has also become one of the limitations that affect the test rate.Based on the introduction of the overall structure of an integrated circuit tester,this paper focuses on the establishment of the communication model in the control backplane module,proposes a design scheme of the integrated circuit tester backplane module,and provides the clock Signal synchronization design.The main research aspects are as follows:1.Establishment of backplane module communication model.Based on the PCIe bus,the thesis first establishes a system-level communication model between the control module and the backplane module.The communication function is the core function of the backplane module of the integrated circuit tester.It can complete the test command issuance and test data return of the integrated circuit tester control module and each test submodule.2.Establish a customize communication bus model.The communication between the backplane and each test module is performed by a custom communication bus.The custom communication bus module needs to convert the PCIe protocol into the custom bus data used by the test module and distribute it to each test module.3.Clock signal synchronization scheme.The backplane module needs to provide a working reference clock and a data transmission clock for each test module.On the basis of explaining the impact of the clock signal on the test results,this paper proposes a clock synchronization scheme and some test results.