Design And Implementation Of High Precision And High Speed ADC Test Scheme

With the continuous development of electronic information technology,the integration degree and complexity of integrated circuits are continuously improved,and the requirements for integrated circuit testing are also continuously improved,and integrated circuit testing technology is developing toward a trend of high automation and integration.Digital-to-analog converter(ADC),as a hybrid integrated circuit,requires not only digital signal testing but also high-precision analog signal testing during testing,which puts special demands on integrated circuit testing equipment.With the continuous improvement of ADC accuracy and speed,the test demand for high-precision high-speed ADC is increasing day by day.The research content of this subject is the design and implementation of a high-precision high-speed ADC test program,and a detailed analysis of the design ideas from test methods to hardware and software.The main research contents of the subject are as follows:(1)According to each index parameter of ADC,put forward corresponding test methods and index requirements for test equipment to form a comprehensive test plan.ADC parameters are mainly divided into DC parameters,static parameters,and dynamic parameters.Among them,high-precision testing of static parameters and dynamic parameters places high requirements on test conditions.The higher the speed of the ADC itself,certain requirements are imposed on the signal bandwidth and data transmission rate of the test system.(2)Select suitable test equipment and build a test system according to the requirements of the test equipment.This article selects the PXIe integrated circuit test system.The PXIe integrated circuit test system is a mixed-signal ATE.On the basis of it,a DIB board can be designed to complete most digital-analog chip tests.However,high-precision ADC testing requires high-purity and high-precision sinusoidal signals and low-jitter clocks.To suppress noise and bias on sinusoidal signals,filtering and calibration links are added,and a phase-locked loop is used to generate extremely low-jitter clocks.(3)Design supporting test software.The test software can complete basic functional tests,DC parameters,static parameters,and dynamic parameter tests at one time.Among them,a lot of data statistics need to be done in the static parameter test,and the fast Fourier transform needs to be done in the dynamic parameter test.In the process of the fast Fourier transform,problems such as spectral leakage will be encountered,and windowing functions and interpolation will be needed..(4)The AD9643-250(14bit / 250MSPS)was selected for testing,and the complete parameter test results were obtained.The main parameters of the ADC are: bandwidth 1GHz,INL ± 1.5LSB,DNL ± 0.25 LSB,signal-to-noise ratio 70.6dBFS,spurious-free dynamic range 85 dBc,etc.This paper designs a complete set of high-precision and high-speed ADC test solutions,implements all the parameters of the ADC test,meets the high-precision high-speed ADC test requirements,and provides a complete set of test solutions for high-precision and high-speed ADC testing.