Analysis And Research Of TFT-LCD Bright Defect

In recent years,our country's business group has actively arranged and entered the field of liquid crystal panel.The Chinese liquid crystal panel market is becoming the world stage.How to survive in the fierce competition has become a new problem for panel companies.However,compared with panel enterprises in other countries,we have a gap in raw materials,display technology and industrial chain layout,and are greatly restricted.Starting from the improvement of production yield,we can quickly get out of the dilemma,achieve the purpose of improving enterprise profits,and make panel enterprises competitive.In order to improve the yield of production,first of all,the lack of yield was studied.With Plato's analysis data,the research benefits were maximized,and it was clear that the proportion of bright spots was the largest.Then,from the analysis of defect quality specification data,it is confirmed that customers' requirements for highlights are the most stringent.On this basis,the research topic of bright spot defect is determined.Improve the method of data collection for bright spots and defects,combined with TFT LCD theoretical basis and technological process,first of all,analyze the linear relationship between product design differences and highlight defects,and confirm the deficiencies of product design;then study the defect detection equipment,and confirm that there is a problem of omission in the detection of highlight defects;finally,study the theoretical model of highlight defects,cooperate with case analysis,and find the lack of repair methods.In the product design,through testing the difference of the characteristics of the key storage capacitor devices,combining with the theoretical model,it is proposed that by improving the design driver,using the experimental verification,determining the optimal v-com can reduce the gray value of the bright defects to a certain extent.In terms of product detection,as for the problem of reducing the detection and leakage of bright spot defects,the detection principle and process of the equipment are deduced,and the analysis results prove that the defects detected by optical and electrical measuring equipment have a certain probability of omission,which results in leakage repair.For the detection,a new process is redesigned,through adding the function of defect overlay positioning on the equipment software,the defect leakage of bright spot type is realized Improvement of release.In terms of product repair,this paper analyzes the repair rules of existing bright spot defects,studies and puts forward a new repair method,which can improve the repair success rate of bright spot defects,reduce the scrap rate of panels,and improve the repair efficiency through multi batch experimental verification.Comprehensive in-depth research from three dimensions of product design,product detection and product repair,respectively,put forward the improvement strategies of highlight defects,combined with the actual testing and verification,apply the reasonable and effective improvement strategies to panel enterprises,achieve the research and improvement of highlight defects to improve the production yield of products,and enhance the competitiveness of enterprises.