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Research On RF Device Performance Test Method In TDMA System:Generation And Analysis Of GSM/EDGE Signals

Posted on:2020-05-12Degree:MasterType:Thesis
Country:ChinaCandidate:J CaoFull Text:PDF
GTID:2428330602450732Subject:Engineering
Abstract/Summary:PDF Full Text Request
In the mobile communication system,the RF communication devices is an indispensable component,and its performance directly affects the advantages and disadvantages of the whole machine.Therefore,in the research and production process of RF communication devices,testing the performance of the RF device becomes an indispensable task.At present,the traditional test is concerned;it is usually used to test the noise parameters,1dB compression point,nonlinearity and other indicators of the RF communication device by using different devices such as an oscilloscope,a spectrum analyzer,a vector analyzer,and a signal source.The test system is complex and takes up a lot of resources.At the same time,it is impossible to test the comprehensive impact of multiple indicators on the overall performance of communication equipment.However,due to the wide application of TDMA systems in communication systems,TDMA can be seen in the earliest digital mobile communication systems GSM,EDGE or TDD-LTE currently used,as well as communication systems such as satellite communications and fiber-optic communications.Therefore,it is of great significance to study the test methods of RF communication device under TDMA systems.This paper proposes a test method for the comprehensive performance of the new RF communication device under the TDMA system.Compared with the traditional test method,the test method is simple and convenient,and takes up less resources.The main design idea of the test method is to directly generate a test signal conforming to the protocol standard,and input the test signal to the RF communication device,analyze the constellation diagram and eye diagram of the output signal about RF communication device,and simultaneously perform constellation diagram on the demodulated output signal.Perform EVM analysis and use the calculated value of EVM to directly determine the comprehensive impact of multiple performance indicators of the tested RF communication device on the communication device.After the basic idea of the test method is put forward,the software simulation and hardware implementation of the test signal generation by MATLAB software simulation tool and FPGA hardware implementation platform are carried out.The MATLAB simulation waveform is compared with the MODELSIM simulation waveform to obtain the signal generation.Correctness,through the comparison between the MODELSIM simulation waveform and the output waveform of the oscilloscope,the correctness of the hardware implementation is obtained.At the same time,the new test method was verified by MATLAB.The specific method is:using MATLAB to simulate two different characteristics of the RF communication device,calculating the EVM of the output signals of the RF communication device,and calculate the EVM of the simulated two RF communication device output signals,and the EVM value obtained will be given in the 3GPP protocol.The EVM standard values are compared to obtain the overall performance of the device under test.Through software verification,the performance of the two RF communication devices simulated in the paper,one of the tested devices' EVM meets the requirements and it can be used for normal communication,and the EVM of the other device under test does not meet the requirements and Further optimization is needed before it can be used in normal communication.The source of the paper is based on a major research project in collaboration with the Ministry of Science and Technology.The paper combines software and hardware to generate standard test signals.The standard signal is software verified for the proposed test method.The feasibility of the test method is verified from the software level,which provides a fast,effective and resource-intensive test method for testing the performance of the RF communication device.
Keywords/Search Tags:TDMA, EVM, Test Signal, 3GPP
PDF Full Text Request
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