Design And Implementation Of Burn-in Testing System Of Memory

Along with the development of the digital circuit,digital integrated circuit technology with each passing day,the memory as a product development of digital technology,high-speed frequently read and write operations on the service life of the memory and can bring certain influence product performance,according to a statistical results show that Google's 80% of the world's memory fault is not the core problems of its own hardware.In order to evaluate the quality of memory,it is necessary to test the degree of memory aging with the help of the memory aging test system based on digital circuit design,and the test results are used as a reference index to evaluate the quality of memory.Screening test in this paper,for the reliability of the digital circuit,memory aging principle and method for the knowledge related to research,to the sophisticated device testing system of the composition,working principle,structure characteristics,technical indices,this paper analyzed the content,based on sophisticated storage test work to make the function of the system design,mainly around the menu management,device management of library and aging control section to design to implementation,and uses the MYSQL database to complete the design of the database logic.The system use C/S architecture to design and implement the system,and the front-end part uses Delphi software to develop the functions,and completes the design of the corresponding program interface according to the system design scheme and user requirements.Finally,this paper summarizes the work done in the paper,analyzes the problems and shortcomings of the software system,and explores the positive significance of the research on the memory chain control system for the real-world digital circuit sophisticated test experiment.