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The Design And Implementation Of Software System For Integrated Circuit Burn-in Test Equipment Based On Embedded Linux

Posted on:2015-02-20Degree:MasterType:Thesis
Country:ChinaCandidate:G H ChenFull Text:PDF
GTID:2268330428965117Subject:Signal and Information Processing
Abstract/Summary:PDF Full Text Request
With the rapid development of information technology, semiconductor integrated circuits is widely used in communications, electronics, computers and related fields. The reliability problems of integrated circuits have attracted more and more people’s attention.In military weapon system, aerospace electronics and industrial control et al special occasions, the reliability of integrated circuits is occupies very important position, even as the importance of performance of integrated circuits itself.Make the fault of integrated circuits exposed as early as possible before using and screen qualified products out is an important method to improve the reliability of integrated circuits.Integrated circuit hign temperature dynamic burn-in test is a process that load high temperature stress and all kinds of functional testing vectors on the chips at the same time, let the chips overworked and make its defect accelerated exposed, so as to eliminate defective chips.This thesis mainly research the design and implementation of software system for integrated circuit burn-in test device,then puts forward a kind of design scheme based on embedded Linux software system. The burn-in test device through the network transmission between the embedded system and the upper machine based on C/S architecture, according to a variety of communication interface protocols to package or parse data frame,realize the parameter configuration,flow control and the real-time data monitoring.The whole works of this thesis is as follows:First introduce the research background and significance.Research status quo of burn-in test technology has been made the detailed introduction. The software systerm is closely related with the hardware design. Then introduced the hardware system structure of the burn-in test device which the embedded system as the core control system, mainly includes power supply system, signal occur and detection system, signal drive system and ARM9embedded microcontroller processor.The soft system design which based on the embedded Linux system is the key point of this thesis.First through the establishment of the cross development environment, modify the Bootloader source, transplant the Linux kernel and making Linux root file system, complete the construction of the embedded Linux system software platform.Then, according to the different interfaces of hardware and the embedded system, develop the Linux device drivers which is closely related to the hardware interfaces after analysising of the Linux kernel system call.On the basis of Linux device drives,we complete the embedded system application program development,realize communication between the ARM core system and other hardware modules.Finally,verify the system design scheme by selecte analog chips, digital chip and memory chips for burn-in test. Through capture the test signal and the detected signal, analyze the debugging of the whole system to verify whether the design of this system achieve the basic requirement.At the end of the thesis, the complete contents of this thesis are summarized, and the future work to accomplish is put forward.
Keywords/Search Tags:Integrated Circuits, Test during Burn-in, System Transplantation, Driver Development, Interface Protocol, Application Program
PDF Full Text Request
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