Design Of Testability And Its ATE Implementation For Multi-core Processor

As the development of integrated circuit in the field of nano technology,the design for test(DFT)technology has also kept growing.For different kinds of chips,differen t DFT technologies has been produced and they better keep the chip quality.But with the increasing of the nano faults and the growing of the chip clock,DFT is becoming more and more difficult,which takes a serious challenge for chip test.The DFT technologies of digital IC and its implementation by ATE is mainly investigated in the dissertation.The research is in the context of 4-core general purpose processor,which uses SMIC40 nm process and with a CPUIP controller module inside.This module is used for the study of DFT of digital IC and how to implement the chip production test on the ATE.There are mainly two parts which is discussed in the dissertation.First,based on the digital part of the CPUIP module,a DFT flow is implemented.scan technology is used in this part,and after finishing scan,it begins to do the auto test pattern generation(ATPG),finally do the functional and timing simulation of the pattern.This part is achieved by coding and EDA tools.Second,how to achieve mass production test on ATE.The ATE development process from the hardware and software aspects are introduced in it,then the program debugging process and the flow of chip product are also introduced in this part.In the face of many test Patterns,considering the factors of both the commissioning time and the occupation space of ATE,the debugging method of compressing partial patterns is proposed to save the test cost.in order to improve the reliability of the product,increase the ultra-high voltage test items and analysis method of chip test index are proposed.according to the demand of the actual product,the test flow of multiple sub-bin is put forward,it can save test time and improve the chip yield.The DFT technology introduced in the dissertation can be used in industrial production,especially DFT design process,the development of ATE production test procedure and debugging method in the dissertation can well solve the long term of chip mass production test program development and the low yield of chip test in the industry.it has certain reference significance at the same type of industry design.The technologies above have been utilized in the development of a processor of China,now the chip has been applicated on the desktop and server at present.