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Video Decoder Chip Test Program Development

Posted on:2009-06-30Degree:MasterType:Thesis
Country:ChinaCandidate:N WangFull Text:PDF
GTID:2208360272489608Subject:Electronics and Communications Engineering
Abstract/Summary:PDF Full Text Request
GX2001 is a video decoder chip that is fully developed by domestic company and has full copy-right on all the technology used in that chip. It uses multiple self-developed copy-right technology including edge processing and multi-frame algorithm and has good cost performance and great stability. Before the chip go to production, customer have asked us to develop final test program for it and prepare for massive production.J750 is one of the ATE developed by Teradyne. It provides highly economical, parallel test solution of high-performance microcontrollers, consumer SoC devices, and digital wafer sort applications. J750 provides a maximum 100MHz data rate, 1024 digital channels, CTO/MSO option for mix signal devices. Different modules have different performance and of course different price, which makes customer easy to have a balance between performance and cost.This article is written in 5 chapters. 1st chapter gives a brief introduction of what GX2001 is including the basic characterize of the chip and the function and relationship of different module in the chip. 2nd chapter talks about chip testing requirement from customer. GX2001 is a QFP208 package with 177 used pins. It also discusses about the some test methodology that need to be required by the chip based on the test instruction from customer. 3rd chapter gives a introduction of J750 system. After it gives an overview of J750 hardware diagram and specification, it introduces IG-XL software's basic concept and also how to use IG-XL to generate a test program. Last part gives a brief overview to SmarTest PG which is used to convert pattern to the format tester requires. 4th chapter is focus on test program development for GX2001. After discussing loadboard development, it spends more time to explain on PLL/DAC/ parametric/functional test development. 5th chapter describes the progress on test program debug and issue was seen during the debug. Also the final solution has been provided to the final test program.
Keywords/Search Tags:IC Testing, Video Decoder Chip, J750, Auto Test Equipement
PDF Full Text Request
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