Study Of RF Chip Testing Technology Based On ATE

With the rapid development of wireless communication technology and increasing needof information and fast and reliable ways of communication, RF technology has been widelyused in21stcentury. And thanks to the improvement of chip manufacturing technology, thecost of the silicon devices has been declining, but the cost of test still remains stable,especially the test of RF chips. Thus, the test of RF chips is very important.This thesis took a LNA as an example, simulated the input and output impedancematching of the test circuit of the chip, improved and optimized the test circuit using thesoftware of Agilent ADS. Based on the design process of the test board using Protel DXP, thecontrol of the impedance of the test board has been achieved, and finally completed thedesign of RF test board. According to the theory of RF and ATE test, parameters of the LNAsuch as S parameters, noise figure,1dB compression point and third-order intermodulationhave been tested and the multi-site test of RF chip has been realized by using TeradyneUltraFLEX.Also, LabVIEW has been used to control the DC power, microwave signal generator,microwave network analyzer and signal analyzer to build a global LNA test system(alsocalled a test-bench). ATE test has been compared with the test using test-bench, anddifferences between the two test methods have been summarized.In this thesis, a deep research has been made into RF testing technology by designing atest board, developing, debugging and optimizing test program. The completion of this studyhas shorten the testing time effectively, improved the throughput of test, reduced the cost ofthe test, and laid foundation for the product testing of core chips in wireless communicationfield such as radar, satellite navigation,3G communications and Internet-of-Things.