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Research On ATE-Based Multi Channel RF Receiver Chip Test

Posted on:2019-02-16Degree:MasterType:Thesis
Country:ChinaCandidate:Q DaiFull Text:PDF
GTID:2348330569987613Subject:Engineering
Abstract/Summary:PDF Full Text Request
In the application of phased array radar,RF(Radio Frequency)receiver chip is a core competitive product unit.The chip receives waveform low-power signal from sky that is reflected by the tested object.The mixer,filter and LNA process the S L waveband RF signal by frequency conversion,filtering and signal amplification,and then the processed signal drives the next digital processing chip.Including both RF receiver part and analog-digital conversion part,the structure of this chip is quite complicated.The requirement of consistency in phase and gain between multi channel and that of filter parameters are both high.In order to ensure the consistency of the high quality of chips,we have to conduct whole parameter test,which makes higher demands on the credibility of test system,design and manufacture of the Loadboard as well as the cooperative application of handler.Firstly,based on the structure characteristic of RF receiver and the requirement of the test program,this thesis designs the schematic diagram of the RF test board in order to avoid the interference between the signals during the multi-channel parallel test and to unify the test standard of the phase consistency by adding reference chip.Due to the restriction of the test resources and cost,in order to deal with the lack of RF channel,we extend and reuse the RF channel by applying the power divider,coupler and phase shifter into designing the RF test board.By using PADS we achieve the locating and wiring of the board,which realizes the impedance control of RF signal transmission.All of the efforts mentioned above accomplish the design of the Loadboard.Secondly,based on the principle of RF testing,we develop and debug the test program on several parameters such as gain,noise figure,phase,insulation,Spurious Free Dynamic Range(SFDR)and etc.by ATE(Automatic Test Equipment)ADVANTEST V93000.The test program can set and call the hardware resources appropriately,which can finish the test project accurately and fast,and do comparative analysis of the test data.Last but by no means the least,due to the requirement of tri-temperature test for RF receiver chip,we choose Castle handler to set up mass production test platform as well as design and produce Docking,seal adaptor,kit and ship in order to ensure the accuracy and credibility of the chip transmission.By accomplishing tri-temperature mass production test for multi-channel RF receiver chip,we provide statistical analysis on parameters in various temperatures,optimize testing procedure and improve testing program.The thesis conducts in-depth study on multi-channel RF parallel test technique by scheming mass production test for multi-channel RF receiver chip,designing Loadboard and developing,debugging as well as improving test program.The accomplishment of the test reduces the test time effectively,and decreases the test cost.
Keywords/Search Tags:multi channel RF test, ATE, tri-temperature production test, Loadboard, test program
PDF Full Text Request
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