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Research And Implementation Of MCU Chip Testing System

Posted on:2016-06-20Degree:MasterType:Thesis
Country:ChinaCandidate:Z H YangFull Text:PDF
GTID:2348330542974023Subject:Control theory and control engineering
Abstract/Summary:PDF Full Text Request
MCU(Micro Control Unit)chip called the micro control unit,also known as single-chip,is an important part of many in the control circuit.MCU chip design and manufacturing development according to depend on the test of the chip,along with the increase in the number of test chip pins,the function of the chip is increased,the complexity and testing time chip testing increases.Chip testing system since 1965 has gone through four stages,the current chip test system both in the test speed or in test pin count than ever before has been greatly improved,but any one chip testing system can completely meet the caused by the update of test task requirements due to the new time chip.Design of high security,high test efficiency and test the system upgrade chip testing system of low cost chip testing direction.This subject comes from the aerospace science and technology group Beijing space center 12 th research institute two commissioned projects,playing the instrument programmable chip test system,optical cable transmission system can verify the system chip,based on MCU chip design specific test system on chip testing method,the overall structure of the system design are deeply studied,the main research work and achievements of the the results are summarized as follows:(1)In order to improve the efficiency of the chip test system,test method proposed a universal test set chip,chip test vector is given for the subject,in the premise of not affecting the fault coverage,reducing the number of tests,improves the test efficiency.(2)In order to solve the problem of high cost upgrade test system,the test system is designed for the distributed structure,the system is divided into management layer,the middle layer,execution layer.Management layer is composed of the upper machine,the test vector all stored in management layer,if the same type of tested chip function change,as long as you can upgrade to the host computer,can reduce the cost of testing system upgrade.(3)In order to ensure the safety of the test,in the execution layer design of anti inserted opposite circuit,ensure the test process due to improper operation,inserted opposite the chip will not be burnt.At the same time,the realization of each module of chip design and test system,test system can be put into use.(4)For the correctness of the design verification chip test system,test the function and performance of the chip testing system.Functional testing is to verify the test system can complete the subject requirements,the proposed technique,performance testing is on security,system operability,scalability test.Finally analyze the shortage of test system,determine the optimal scheme.
Keywords/Search Tags:chip test, fault coverage, test vector, distributed system, safety
PDF Full Text Request
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