Design Of Aging Prediction Sensor In Digital Integrated Circuit

Microelectronics technology is one of the important technologies in the information age in the twenty-first Century.It is an important factor in the progress of science,technology and the development of social economy.It is the basis of computing technology,automatic control,nanotechnology,communication technology,and people's demand for the reliability of integrated circuits are getting higher and higher.With the increasing of the integration,the shrinking of the characteristic process size,and the synchronous growth of the performance and power consumption,aging caused by the NBTI effect has become an important factor affecting the reliability of integrated circuits.Firstly,the reasons and main factors affecting the reliability of integrated circuits are introduced.The main factors that affect the reliability of integrated circuits are the aging and soft error.The aging and soft error protection methods are analyzed in this paper.On the other hand,aging protection methods can be divided into aging detection and aging prediction.The working principle and mechanism of aging prediction and aging detection are analyzed by circuit timing diagram in this paper.Secondly,in view of the disadvantages of traditional aging prediction sensor structure,a programmable aging prediction sensor for soft error is proposed in this paper.The new type of aging prediction sensor introduces soft error protection method into the structure of aging prediction.The sensor structure can not only predict the aging of the circuit,but also can resist the soft error.The delay element introduced in the frame of the sensor can achieve the purpose of changing the width of the protection area by changing the number of the switches of the ground.Finally,the protection area is programmable.The paper also proposed a sensor that the protection area width can be controlled.The new sensor is improved based on aging detection technology,so that the sensor has the function of aging prediction.At the same time,it can reach to change the protected area by changing the width of the input clock signal waveform.In the output part of the sensor,the C-element is used to replace the traditional latch,which reduces the area cost of the whole touch sensor.Finally,the simulation software is used to simulate the sensors in this paper.The experimental data of different conditions are used to observe the sensor's resistance to aging and soft fault.At the same time,the area cost and power consumption of the sensors are compared with those of other classical aging prediction sensors.Experimental results show that the sensor has many advantages.