The Research On Test Technology Of Aging For Digital Integrated Circuit

With the advent of cloud computing and big data, the reliability of integrated circuit is highly required. Besides, shrinking the size of transistor and thickness of lattice oxygen made NBTI effect become the important factor which influence the reliability of integrated circuits. Some scholars have conducted lots of studies and also proposed a lot of monitoring structure. The main work of this paper is as follows:Firstly, some basic knowledge of aging and several factors caused aging are proposed. Then the two aging test technology which these are aging detection technology and aging prediction technology are proposed in detail, and their structure and working principle are focused analysis. Finally, comparing two aging test techniques and simply analysis of their advantages and disadvantages.Secondly, the paper introduces two kinds of aging prediction structures because aging prediction are widely used in anywhere, these are stability checker based on predictor and pre-sampling based on predictor. On the one hand, their structures and working principles are focused analyzed. On the other hand, their deficiencies are also analyzed conclusively.Thirdly, we introduce a low-cost programmable aging-aware flip-flop in the light of the deficiencies of aging prediction structure. Delay element is inserted into the clock network. By doing so, we can minimize the aging effect of the delay element. The innovation of this paper is that the delay element is designed to be programmable, so we can adjust the width of guard band and save some wiring overhead and area overhead and greatly improve the accuracy of aging prediction.Finally, simulation experiment is carried out under different conditions, and relevant data will be obtained. Analyzing the performance, power consumption and area overhead through the experiment, and compare to classical reference structure. The experimental results show that the proposed low-cost programmable flip-flop can dynamic adjust the size of monitoring window, so it can detect the different degrees of aging, and greatly improve the accuracy of the prediction of aging, and this structure is low-cost, which decrease the area overhead and power consumption.