| In recent years, with the rapid development of semiconductor technology and optoelectronics,a lot of optoelectronic devices have been widely used in various fields. Among them, Charge-Coupled Device(CCD) has the merits such as transforming light to electricity, small pixel size, high precision geometry, stable performance. So it has been widely used in the field of non-contact diameter measurement.With respect to the contact diameter measurement, non-contact diameter measurement has the feature such as high speed test, high accuracy and low environmental requirements, so it has been used widely.In this paper, based on linear CCD non-contact diameter measurement system has been systematically studied, combined with the characteristics of the subject for60mm diameter measuring specific materials, so I have put forward the specific design of this topic. The design did not use the common optical imaging system but use light-emitting diodes as a light source illumination directly.In the research process, the paper mainly has completed the following work.1.1Described the development of the status quo and trend of non-contact diameter measurement.2.Through analyzing the principle and features of linear CCD,I designed a diameter measurement system based on non-contact linear CCD.3.1analyzed several methods for the CCD driving circuit design, and the final decision is that based on the CCD driver circuit C8051F020MCU. The system used five pulses of C8051F020microcontroller producing to drive CCD, then conversed the CCD video signal with AD port of C8051F020microcontroller, the digital conversion could communicate with PC by serial RS-232.4.PC software which designed by Lab VIEW received and processed data, it used a differential method of boundary treatment for receiving and stored the data. I added a range of standard workpiece into the system to be calibrated and analyzed measurement error and gave the method of elimination of errors in order to achieve higher measurement accuracy. |
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