Research On Key Technology Of General Automatic Test System

Along with the modern equipment and appliances developing, especially theembedded and other high-end, sophisticated platform products constantly upgrading,product testing become more onerous. The traditional test means is single, low efficiency,test result just passable. At present, many domestic and foreign researchers studied on thecircuit board assembly and other products of the test, but the lack of parameters, testprocedures and test procedure can be in-depth study of reconfiguration of universal. Thetraditional design for the special test system functions are fixed, when upgrading productsetc, the old system was eliminated and need to design new special system. Causing thewaste of hardware resources and funds, hindering enterprise development footsteps.Therefore, there is important significance to design a general testing system to test qualityimprovement and expansion of the scale of the company. However, the universalautomatic test design and test process of the system will also encounter many problems,such as: it is difficult for the hardware to meet the different types of product testingrequirements, software and hardware’s configuration is bad, it is difficult to edit testparameters, test procedures and test process, low automatic focusing efficiency ofmachine vision image acquisition and so on.This paper analyses the existing ubiquitous problems of general automatic testsystem, mainly studies the three key technologies, completed the design of the relevantprocedures including: program module can be configured, high-speed data acquisition,processing and data storage program, automatic focusing procedure, also completed aseries of validation experiments. In the design process using the virtual instrumenttechnology, based on LabVIEW high-speed data acquisition, analysis and storagetechnology, focusing evaluation theory and auto focusing technology. Finally realizesflexible configuration of multi parameters and multi program module, data acquisition,processing and recording speed and stability, as well as1hosts and2sets of testingmachine interaction data communication; also realizes automatic focusing speed machine vision monitoring. This paper provides a good basis for the development of the universalautomatic test system for the next step. In this paper, the parameters and the softwaremodule configuration, and evaluation and peak step focusing combined AF scheme hascertain innovation.