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Design And Implementation Of High-speed And High-resolution Data Convertor Test System

Posted on:2018-03-30Degree:MasterType:Thesis
Country:ChinaCandidate:J J ZuFull Text:PDF
GTID:2348330542953185Subject:Electronic and communication engineering
Abstract/Summary:PDF Full Text Request
Analog-to-digital converters(ADCs)and digital-to-analog converters(DACs)are the key components of analog and digital interfaces.The huge demand for high-speed,high-resolution ADC/DAC in the fields of communication,signal processing,instrumentation and radar,has resulted in an increasing demand for high-speed,high-performance and cost-effective test systems.High-speed,high-resolution universal ADC/DAC test system design and implementation is of great significance.The purpose of this paper is to design and implement a high-speed and high-resolution ADC/DAC performance parameter measurement system.The maximum sampling rate of the test system is 3.6GS/s,and the highest resolution is 16 bits.Firstly,this paper introduces the characteristics of data converters and assessment method of the performance parameters.Then,this paper designs the construction of data converter test system and different test scenarios for ADCs and DACs,in order to meet the test environment requirements of different performance parameters.According to the working principle of GPIB bus system,this paper builds the remote control environment of the system test devices,connects the computer and the test devices by GPIB interface,sends the programming control commands to the instrument using VISA library function and fetches the measurement results,to realize the automatic control of the entire system.Next,this paper determines the modular design method of the test system,and the high-speed data processing platform is divided into data processing and communication control modules,respectively designed on FPGA and ARM platform.This paper uses FPGA Virtex6 to build processing system,and uses ARM S3C6410 platform to design communication control system,which makes high-speed data processing platform could achieve signal acquisition and data processing under the control of hundreds megahertz working clock.For different ADC/DAC test objects,users only need to replace the test child board,without replacing the hardware platform of the test system,which makes the system meet the configurability requirements.Furthermore,based on Lab Windows/CVI development environment,this paper designs the system control software based on C language,and designs the human-computer interaction interface of ADC and DAC test from the user's point of view,sends programming control commands the test chip,retrieves test data,and calculates performance parameters.In this paper,4 commercial high-speed and high-precision data converters are used as test cases,which are AD9268,ADC 12D 1800,AD9739 and AD9959,to verify the system from the two aspects of high-speed and high-precision.The test system meets the design requirements and can be used for high-speed,high-resolution ADC/DAC testing.
Keywords/Search Tags:High-Speed and High-Resolution, ADC/DAC, Automatic Test System, Virtual Instrument
PDF Full Text Request
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